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SET-3000, High-Density, Modular Architecture, Semiconductor Test System

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National Instruments - SLSC Series - SET-3000
National Instruments - SLSC Series - SET-3000 - Wiring
SET-3000 New
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National Instruments - SLSC Series - SET-3000
National Instruments - SLSC Series - SET-3000 - Wiring
SET-3000 New
SET-3000 Refurbished

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National Instruments SET-3000 Semiconductor Test System

The National Instruments SET-3000 is an advanced hardware platform tailored for semiconductor testing applications, specifically designed to perform fault insertion and signal simulation with high precision. The SET-3000 integrates into HiL test environments and allows fault conditions like open-circuit and short-circuit situations. This makes the SET-3000 an essential component within such areas as automotive and aerospace industries, which demand a very high level of testing procedures where faultless safety and dependability for the electronic component must be ensured.

The SET-3000 is based on a modular PXI platform developed by National Instruments and hence offers scalability and flexibility in semiconductor test systems. Equipped with high-density fault insertion modules, the SET-3000 allows the engineer to simulate complex fault scenarios with the retention of precise signal integrity. Most importantly, the SET-3000 addresses production test applications where speed and repeatability are of paramount importance, enabling the manufacturer to quickly find and eliminate prospective device failures throughout the production cycle.

The SET-3000 grants ease of integration with industry-standard software like LabVIEW and TestStand, adding flexibility in automated test systems. Equipped with programmable fault conditions, the SET-3000 ensures that digital and analog signals are thoroughly tested for performance under a variety of fault conditions, hence becoming an essential tool in device performance analysis. Modularity within the SET-3000 allows easy upgrades to address changing test requirements and enables long-term usability in multiple applications.

Besides its fault stimulation capabilities, the SET-3000 demonstrates extraordinary performance in real-time data acquisition and high-speed signal processing. Such features make the SET-3000 a reliable solution for a semiconductor production line where the least amount of downtime and consistency maintenance is of prime importance. The compact design and energy efficiency of the SET-3000 further enhance its suitability for application in laboratories and manufacturing processes where there are often highly imposing constraints on space and power.

Model NameSET-3000
Part TypeSemiconductor Test System
Operating Humidity10%-90% Relative, Non-Condensing
Storage Humidity5%-95% Relative, Non-Condensing
Operating Temperature0°C to 40°C (Forced-Air Cooling)
Storage Temperature-40°C to 85°C
Maximum Altitude2000 meters above sea level
Fault SimulationOpen/Short Circuits, Pin-to-Pin Shorts
Software IntegrationCompatible with LabVIEW and TestStand
Channel DensityHigh-density modular PXI architecture

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SEG-3000, SET-W000, SET-3P00, SET-30O0, SET-300O
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